/ Chen, Julian (Adjunct Senior Research Scientist and Adjunct Professor, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University)

Introduction to Scanning Tunneling Microscopy Third Edition

Auflage	3 Revised edition
Seiten	528
Verlag	Heinemann Publishers Oxford Customer Services Dept.
ISBN	9780198856559
Artikel-Nr.	617137

Lieferzeit ca. 5 Wochen

Introduction to Scanning Tunneling Microscopy Third Edition

Print-Ausgabe

Zuletzt angesehen

The Limits of Trauma Discourse